Base on above failure analysis, returned sample #1 “Internal charge pump and VOUT ESD cell damage” and sample #2 “Internal charge pump damage” are suspected a very high energy suddenly got into device and damaged suspected.
Base on above failure analysis, returned sample #1 “Internal charge pump and VOUT ESD cell damage” and sample #2 “Internal charge pump damage” are suspected a very high energy suddenly got into device and damaged suspected.<BR>