For thin coating thicknesses, techn

For thin coating thicknesses, techniques for thickness characterization requires a high level of precision. On composite structures, actual bulk wave methods can be impaired by the presence of a periodic metallic mesh on its surface, thus reducing their performance. In this paper, a technique based on guided waves is proposed for coating thickness characterization. This method relies on the interpolation of the linear behavior of the S0 mode at low frequency with regard to thin coating thicknesses. It is demonstrated numerically and experimentally that coating thickness can be estimated within 10μm of the actual coating thickness.