At the same time, a white light interferometer is used to analyze the scratches on the GaAs surface, so as to obtain the characterization method of the scratches.
At the same time, the scratches on the surface of GaAs are analyzed with a white light interferometer in order to obtain the characterization method of scratches.
At the same time, white light interferometer is used to analyze the scratches on GaAs surface, so as to obtain the characterization method of scratches.<br>