Vacuumtubeswerecentraltotheearlydevelopmentofelectronics,butwerereplaced,decadesago,bysemiconductortransis-
tors.Vacuumchanneldevices,however,offerinherentlyfasteroperationandbetternoiseimmunityduetothenatureoftheir
channel.Theyarealsostableinharshenvironmentssuchasradiationandhightemperature.However,tobeaplausiblealterna-
tivetosolid-stateelectronics,nanoscalevacuumchanneldevicesneedtobefabricatedonthewaferscaleusingestablished
integratedcircuitmanufacturingtechniques.Here,weshowthatnanoscalevacuumchanneltransistorscanbefabricatedon
150mmsiliconcarbidewafers.Ourdeviceshaveaverticalsurround-gateconfigurationandweshowthattheirdrivecurrent
scaleslinearlywiththenumberofemittersonthesourcepad.Thesiliconcarbidevacuumdevicesarealsocomparedtoidenti-
callysizedsiliconvacuumchanneltransistors,whichrevealsthatthesiliconcarbidedevicesoffersuperiorlong-termstability.