It is well known that the dielectric constant of X7R sample is the sum of the dielectric constants of the core and shell regions. As a result of the characteristic diffuse phase transition (DPT) of shell materials (solid solution), it often shows a broad dielectric maximum peak, and with the increase of the dopant concentration in shell region, the temperature (Tm) corresponding to the dielectric maximum peak was reduced.10–12 On the other hand, the dielectric constant near Curie temperature (B1251C) strongly depends on that of the core region (BaTiO3). In present study, the core sizes of samples with different sintering methods are similar (B80–90 nm) and the dielectric properties of BaTiO3 ceramics are strongly depressed when the grain size decreases to nanoscale.13,14 Thus, there would be no apparent difference of the dielectric constant near the Curie point between CS-sample and TSS-sample.