Per my personal opinion, refer to below 1st snapshot, I agree the ink pointed by yellow arrow are caused by RDL.But the trace pointed by green arrow, I would say this is happened before bumping process.I don’t have solid evidence to prove my statement, I tried to correction the contrast and brightness of the defect image, refer to below 2nd snapshot.The trace boundary seems beneath the probe mark. Do we have pre bump test AOI data can be referenced?BTW, what device is this? LPC1768UK?This is the only device that we generate RDL bump on probe mark I can recall right now.Maybe we can share this defect image with ASEKH for their comments.