From the information presented so far, Fig. 5 illustrates the photocarrier transport mechanism in the most intriguing type-I HJPT using the FACs/C8-BTBT film stack. The pronounced photoresponse at or near the off-state (i.e. operating under a weak gate-induced electric field) can be related to the observation of the largest increase of the capacitance at zero bias (Fig. 4d). The latter suggests strong formation of photogenerated holes accumulated at/near the FACs/C8-BTBT interfaces43 as depicted in Fig. 5. Such interpretation coincides with the spectroscopic data (Fig. 3) as upon light illumination, no significant charge transfer from FACs to C8-BTBT was observed. The latter is attributed not only to the type-I heterojunction formation between FACs and C8-BTBT (Fig. 1d), but also to the evident edge-on orientation of C8-BTBT (Fig. 1g), which helps those photoinduced carriers to transport along the regions at/near the heterointerfaces of FACs and C8BTBT and manifested as photocurrent.