提出了一种利用电致发光（EL）将应变/损伤与EL亮度响应关联起来的新方

A new method using electroluminescence (EL) to correlate strain/damage with EL brightness response is proposed. Using the naturally randomized EL speckle pattern in the EL-CFRP device, the 2D-DIC method is used to obtain accurate strain results. Intrinsic EL is an electro-optical phenomenon in which a doped phosphor material emits light in response to a strong electric field (usually alternating current). Traditionally, EL is used for lighting applications; however, it is demonstrated here that the structural state and EL brightness changes are interrelated. This takes advantage of the piezoresistive characteristics exhibited by the CF structure, which will cause a voltage drop within the sample and ultimately lead to changes in EL brightness. A new method for continuous SHM using the electroluminescence response of the EL-CFRP structure was proposed, and the electroluminescence piezoresistive response was verified.

A new method is proposed to correlate strain/injury with EL brightness response by electroluminescence (EL). Using the naturally randomized EL scattering map existing in EL-CFRP devices, the precise strain results are obtained by 2D-DIC method. The sign EL is an electro-optical phenomenon in which doped phosphorous materials respond light to a strong electric field (usually alternation). Traditionally, EL has been used in lighting applications; This utilizes the CF structure to exhibit a voltage resistance characteristic, which results in a voltage drop in the sample, which eventually results in a change in EL brightness. A new method of continuous SHM using electroluminescence response of EL-CFRP structure is proposed, and the electroluminescence pressure resistance response is verified.

A new method is proposed to correlate strain / damage with El brightness response by using el. Using the naturally randomized El speckle patterns in el-cfrp devices, the accurate strain results are obtained by 2d-dic method. Intrinsic el is an electro-optic phenomenon in which the doped phosphor materials emit light response to a strong electric field (usually alternating current). Traditionally, El is used for lighting applications; However, it is proved that the structure state and El brightness change are interrelated. This makes use of the piezoresistive characteristics of CF structure, which will produce voltage drop in the sample and eventually lead to El brightness change. A new method of continuous SHM based on el-cfrp structure is proposed, and the piezoresistive response of el-cfrp is verified.<br>