At present, electronic devices have become an important support of information technology, and the quality and speed of their development is of great significance to promote the intelligence of traditional industries. In view of the problem that the organic heterojunction widely used in electronic devices is still affected by the interface barrier and defect state on the accumulation effect, this paper designs a test system based on LabVIEW development platform to detect the resistance value of organic heterojunction and the characteristic curve when it is used in OFET. The influence of interface barrier and defect state on the formation of the accumulation type organic heterojunction is studied experimentally, and the change of conductivity is analyzed. Using LabVIEW platform to build the test system, the resistance measurement of organic heterojunction and the detection of its output characteristic curve and transfer characteristic curve under the combination of OFET and heterojunction are realized.<br>The system can measure and record data independently and continuously, improve the efficiency of experimental operation effectively, and avoid the experimental error and inaccuracy of data recording caused by human-oriented operation. Compared with the general detection system, it has the advantages of simple experiment, high efficiency, simple interface, high accuracy of data, and improves the automation of the experimental process, which has a good practical reference value.<br>
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